Scanning Electron Microscope NSEM-101 offers high-resolution imaging at 5 nm and magnification up to 200,000 times. It provides one-click autofocus functionality for quick and precise focusing. The unit supports both high and low vacuum modes for handling various sample types. It features a user-friendly software interface for easy operation. This scanning electron microscope ensures rapid evacuation times for faster sample preparation.
| Resolution | 5 nm |
| Magnification | 200,000× |
| Accelerating Voltage | 3 kV to 20 kV |
| Electron Gun | Pre Centered tungsten filament Cartridge / Lanthanum Hexaboride Filament |
| Detector Type | BSE Detector, SE Detector (optional), EDS Detector (optional) |
| Stroke of Sample Stage | 50 mm × 50 mm |
| Max Sample Size | Ø70 mm × 30 mm |
| Expansion Function | Multi-functional in-situ stage (force, heat, electricity) |
| Navigation Functions | Optical image navigation |
| Imaging Modes | Video Mode: 512 × 512 pixels |
| Power Consumption | 1 KW |
| Power Supply | 200 V, 50 Hz |
| Dimensions | 370 × 656 × 633 mm |
Scanning Electron Microscope NSEM-101 is widely used in materials science, semiconductor inspection, biological research, surface morphology analysis, and failure analysis.
