Scanning Electron Microscope NSEM-100 provides high resolution at 6 nm along with a magnification of 150,000×. It features automatic brightness and contrast adjustment for clear imaging. This unit supports multiple imaging modes for versatile observation. It has a plug-and-play design for easy setup and use. Our scanning electron microscope offers continuously adjustable acceleration voltage for flexible testing.
| Resolution | 6 nm |
| Magnification | 150,000× |
| Accelerating Voltage | 3 kV to 18 kV |
| Electron Gun | Pre Centered tungsten filament Cartridge |
| Detector Type | BSE Detector, SE Detector (optional), EDS Detector (optional) |
| Stroke of Sample Stage | 30 mm × 30 mm |
| Max Sample Size | Ø50 mm × 35 mm |
| Expansion Function | Multi-functional in-situ stage (force, heat, electricity) |
| Navigation Functions | Optical image navigation |
| Imaging Modes | Video Mode: 512 × 512 pixels |
| Power Consumption | 1 KW |
| Power Supply | 200 V, 50 Hz |
| Dimensions | 283 × 553 × 505 mm |
Scanning Electron Microscope NSEM-100 is ideal for materials research, semiconductor inspection, biological analysis, surface morphology studies, and failure analysis in various industries.
