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X-ray Diffraction System NXDS-100

X-ray Diffraction System NXDS-100

X-ray Diffraction System NXDS-100

X-ray Diffraction System NXDS-100 features 55 µm silicon multi-channel detector for improved data accuracy. It includes a standard theta goniometer, offering angular accuracy of better than ±0.01° for precise angle measurements. Our unit is built with high-quality components for enhanced durability and reliability. It employs a stepper motor for precise angle measurement in the diffractometer. This diffraction system offers a real-time status display for monitoring operational parameters.

Specifications
X-ray Tube Ceramic X-ray tube, Cu/Co/Mo/Ag optional
X-ray Generator 1200W(40kV/30mA)
600W(40kV/15mA)
Goniometer Standard Theta/Theta Angle measurer
Angular accuracy better than ±0.01 (2θ)
Detectors IDO640 Photon direct reading array detector
IDO1280 Photon direct reading array detector
TPX3Photon direct reading 20 detector
Sample Stages Standard sample stage
Rotating single or 12-position
Rotary automatic sampler
Thin film sample stand
Capillary stand
In situ sample stand
Cooling System Internal air cooling or external water cooling
Operation Control External PC
Power Consumption 1 to 2 kW
Power Supply 200 to 240V AC
Dimensions (L × D × H) 780 × 700 × 910 mm
Weight 120 Kg
Features
Applications

Our X-ray Diffraction System is used to analyze the crystallographic structure, phase composition, and physical properties of materials. It is widely applied in fields such as materials science, geology, chemistry, and pharmaceuticals for research and quality control purposes.

Standard Accessories

Standard sample stage × 1 pc


Rotating sample stage × 1 pc
Capillary sample stage × 1 pc
Flat transmission sample stage × 1 pc
Rotary automatic sampler × 1 pc
In situ sample stage × 1 pc
Manual and automatic slit × 1 pc
Plate Collimators × 1 pc
Anti-scattering cover × 1 pc

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