Raman Spectrometer NRS-100 is a high throughput analytical instrument that combines phenomenon of microscopic imaging along with the spectrometer detection for structural analysis of a compound. It possesses great sensitivity with features such as fully automatic focusing mechanism with enhanced CCD detector system.
Specifications
| Excitation wavelength | 785 nm |
| Spectral resolution | 4 cm-1 |
| Spectral range | 250-2700, 200-3500, and 200-4300 cm-1 |
| Maximum laser output | 500mW |
| Spectral stability | σ / µ < 0.5% |
| Thermal stability spectral shifts | 1 cm-1(10.40 t7) |
| SN ratio | > 6000:1 |
| Detector | TE cooled, semiconductor laser, 2048 (64 x 64) pixel, back-thinned, IR Enhanced CCD InGalt5 cooled for 1064nm |
| Wavelength Range | 200nm-1100nm |
| Pixel size | 14 × 14 µm |
| Dynamic range | 13000:1 |
| Laser wavelength | 785nm (±0.5nm) |
| Microscope camera | 3-megapixel /5-megapixel camera |
| Focusing mechanism | True confocal |
| Laser output | > 550mW |
| Laser spot diameter | >1 µm |
| Laser stability | σ/µ <±0.2% |
| Laser line width | 0.08 nm |
| Connectivity | USB2.0 |
| Electrical controlled X and Y axis 2D platform moving range | 5 X 5 cm |
| Moving resolution | 0.1 µm |
| Positioning accuracy | 1µm |
| Scan speed | 20mm/s |
| Z axis Automated focusing accuracy | ≤ ± 10.2 µm |
| Z axis Automated maximum range | 20mm |
| Z axis Automated focusing speed | Less than 10 s |
| Overall dimensions | 455×455×585 mm |
| Net Weight | 10.5 kg |
Features
Applications
Optional Accessories
| Accessories No | Name |
| 1 | Excitation wavelength of 532, 785, 830, 1064nm |
| 2 | Spectral range down to 50 cm-1 |
| 3 | AAS Flame autosampler |
| 4 | Graphite furnace autosampler |
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Labnics Raman Spectrometer offers high throughput for fast and reliable analysis of various sample types. They are equipped with USB connectivity for seamless integration with external devices. They are equipped with high-resolution cameras for clear and precise imaging. Our units utilize non-destructive techniques to analyze samples with minimal interference. They feature fully automated focusing and scanning modes for efficient and streamlined operation.
| Wavelength range | 200~800 nm |
| Wavelength accuracy | ≤ 0.4 nm |
| Wavelength repeatability | ≤ 0.2 nm |
Labnics FTIR Spectrometer offers highly stable performance with minimal need for adjustments, reducing maintenance efforts. They feature precision machinery that ensures repeatable and reliable scans for consistent results. These units are equipped with advanced optical path designs that enhance overall performance and efficiency. They include a dynamic collimation system and a movable mirror driving system to maintain optimal functionality.
| Wavenumber Range | 7800 ~ 350 cm-1 |
| Resolution | 1 cm-1 |
| Signal Noise Ratio | 30000:1 (4cm-1; sample and background scan for 1 min 2100cm-1) |
Labnics Inductively Coupled Plasma Optical Emission Spectrometer offers precise and reliable analysis of liquid samples with minimal chemical interference. They efficiently analyze multiple elements in a short time, ensuring rapid throughput and quick results. These spectrometers include built-in safety features to protect both the equipment and users during operation. They feature a mass flow controller that regulates gas flow, ensuring optimal system performance and efficiency.
| Sampling time | 100ms - 10s |
| Photomultiplier tube | R212UH |
| Sampling System Specification: - Quartz tubes | 20mm three concentric type |
| Element Detection Limit | 1ppb to 10ppb for most elements |
| Repeatability | RSD < 1% |
| Stability | RSD < 1.5% over 2 hours |
Labnics XRF Spectrometers are designed for non-destructive testing, enabling damage-free sample analysis. They feature safety functions, including radiation protection, ensuring secure operation. These units provide quick, efficient analysis, delivering results in seconds. They support easy integration with external devices, enhancing functionality. Our units feature a touch-sensitive display, ensuring intuitive operation and easy interaction.
| Detection method | Energy dispersion X-Ray fluorescence |
| Accuracy | ±0.01% |
| Machine resolution | 129 ± 5eV |
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| Analysis method | X-ray fluorescence |
| Detection Range | All elements from Mg to U |
| Standard Analysis Range | Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Rb, Sr, Y, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Hf, Ta, W, Au, Hg, Pb, Bi Special elements can be added |
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| Analysis method | X-ray fluorescence |
| Detection material | Alloy elements |
| Detection Range | All elements from Mg to U |